According to the electronic test, the probe can be divided into: A. Optical circuit board test probe: circuit board test before component is installed and open circuit and short circuit detection probe. Most domestic probe products can replace imported products;
B. On-line test probe: detection probe after PCB component board is installed; the core technology of high-end products is still in the hands of foreign companies. Some domestic probe products have been successfully developed and can replace imported probe products;
C, microelectronic test probe: wafer test or chip IC test probe, the core technology is still in the hands of foreign companies, domestic manufacturers actively participate in research and development, but only a small part of successful production.
The main types of probes are: cantilever probes and vertical probes.
Cantilever probe: Blade Type and Epoxy Type
Vertical probe: Vertical Type
1.ICT probes (ICT series Probes)
The general diameter is between 2.54mm-1.27mm, there are industry standard called 100mil, 75mil, 50mil, and the more special diameter is only 0.19mm, mainly used for online circuit testing and functional testing. Also known as ICT test and FCT test. It is also a kind of probe that is used more frequently.
2. Interface Probes
Non-standard probes are typically made for a small number of customers who are large test machines, such as Teradyne and Agilent. They are used to test the contact points and faces of the machine and the test fixture.
3. Micro-Probe (MicroSeries Probes)
The center distance between the two test points is generally 0.25mm to 0.76mm.
4. Switch Probes
Switching probes have a single probe with two currents.
5. High-frequency probes (Coaxial Probes)
Used to test high frequency signals, with shielded ring can test within 10GHz and 500MHz without shielding ring.
6. Rotator Probes
The elasticity is generally not high, because its penetration is inherently strong, generally used for OSP-treated PCBA testing.
7. High Current Probes
The probe diameter is between 2.54mm and 4.75mm. The maximum test current is up to 39 amps.
8.Semiconductor Probes (Semiconductor Probes)
The diameter is generally between 0.50mm-1.27mm. The bandwidth is greater than 10GHz, 50Ω characteristic
9. Battery and Connector Contacts
Generally used to optimize contact effect, good stability and long life.
10. Automotive wiring harness test test probe
Professionally used for automotive wire harness on-off detection, diameter between 1.0--3.5mm, current in 3----50A
In addition to the above types, there are temperature probes, Kelvin probes, etc., which are less used.
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